Characterization of monolayer formation on aluminum-doped zinc oxide thin films.

Abstract

The optical and electronic properties of aluminum-doped zinc oxide (AZO) thin films on a glass substrate are investigated experimentally and theoretically. Optical studies with coupling in the Kretschmann configuration reveal an angle-dependent plasma frequency in the mid-IR for p-polarized radiation, suggestive of the detection of a Drude plasma frequency. These studies are complemented by oxygen depletion density functional theory studies for the calculation of the charge carrier concentration and plasma frequency for bulk AZO. In addition, we report on the optical and physical properties of thin film adlayers of n-hexadecanethiol (HDT) and n-octadecanethiol (ODT) self-assembled monolayers (SAMs) on AZO surfaces using reflectance FTIR spectroscopy, X-ray photoelectron spectroscopy (XPS), contact angle, and near-edge X-ray absorption fine structure (NEXAFS) spectroscopy. Our characterization of the SAM deposition onto the AZO thin film reveals a range of possible applications for this conducting metal oxide.

• Authors: Crissy L Rhodes, Simon Lappi, Daniel Fischer, Sharadha Sambasivan, Jan Genzer, Stefan Franzen
• Journal: Langmuir : the ACS journal of surfaces and colloids (Langmuir) Vol. 24 Issue 2 Pg. 433-40 (Jan 15 2008) ISSN: 0743-7463 [Print] United States
• PMID: 18069859 (Publication Type: Journal Article, Research Support, U.S. Gov't, Non-P.H.S.)

Chemical References

• Aluminum
• Zinc Oxide

Topics

• Aluminum (chemistry)
• Spectrum Analysis (methods)
• Zinc Oxide (chemistry)